Two dimensional parity check with variable length error detection code for the Non-Volatile Memory of smart data

Cihun Siyong Alex Gong, Yung Chang Chang, Li Ren Huang, Chih Jen Yang, Kung Ming Ji, Kuen Long Lu, Jian Chiun Liou

研究成果: 雜誌貢獻文章

1 引文 斯高帕斯(Scopus)

摘要

This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30% redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation.
原文英語
文章編號1211
期刊Applied Sciences (Switzerland)
8
發行號8
DOIs
出版狀態已發佈 - 七月 24 2018

Keywords

  • Data integrity
  • ECC
  • Memory
  • Non-volatile
  • Parity
  • Protection
  • Smart sensor
  • Variable length

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation
  • Engineering(all)
  • Process Chemistry and Technology
  • Computer Science Applications
  • Fluid Flow and Transfer Processes

指紋 深入研究「Two dimensional parity check with variable length error detection code for the Non-Volatile Memory of smart data」主題。共同形成了獨特的指紋。

  • 引用此