Two dimensional parity check with variable length error detection code for the Non-Volatile Memory of smart data

Cihun Siyong Alex Gong, Yung Chang Chang, Li Ren Huang, Chih Jen Yang, Kung Ming Ji, Kuen Long Lu, Jian Chiun Liou

研究成果: 雜誌貢獻文章

摘要

This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30% redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation.
原文英語
文章編號1211
期刊Applied Sciences (Switzerland)
8
發行號8
DOIs
出版狀態已發佈 - 七月 24 2018

指紋

error detection codes
Error detection
parity
Data storage equipment
Automobile electronic equipment
Smart sensors
Cosmic rays
redundancy
automation
pollution
Redundancy
cosmic rays
safety
Pollution
Automation
asymmetry
Radiation
sensors

Keywords

  • Data integrity
  • ECC
  • Memory
  • Non-volatile
  • Parity
  • Protection
  • Smart sensor
  • Variable length

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation
  • Engineering(all)
  • Process Chemistry and Technology
  • Computer Science Applications
  • Fluid Flow and Transfer Processes

引用此文

Two dimensional parity check with variable length error detection code for the Non-Volatile Memory of smart data. / Gong, Cihun Siyong Alex; Chang, Yung Chang; Huang, Li Ren; Yang, Chih Jen; Ji, Kung Ming; Lu, Kuen Long; Liou, Jian Chiun.

於: Applied Sciences (Switzerland), 卷 8, 編號 8, 1211, 24.07.2018.

研究成果: 雜誌貢獻文章

Gong, Cihun Siyong Alex ; Chang, Yung Chang ; Huang, Li Ren ; Yang, Chih Jen ; Ji, Kung Ming ; Lu, Kuen Long ; Liou, Jian Chiun. / Two dimensional parity check with variable length error detection code for the Non-Volatile Memory of smart data. 於: Applied Sciences (Switzerland). 2018 ; 卷 8, 編號 8.
@article{5a121feb2bc847c98c9543173471ef46,
title = "Two dimensional parity check with variable length error detection code for the Non-Volatile Memory of smart data",
abstract = "This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30{\%} redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation.",
keywords = "Data integrity, ECC, Memory, Non-volatile, Parity, Protection, Smart sensor, Variable length, Data integrity, ECC, Memory, Non-volatile, Parity, Protection, Smart sensor, Variable length",
author = "Gong, {Cihun Siyong Alex} and Chang, {Yung Chang} and Huang, {Li Ren} and Yang, {Chih Jen} and Ji, {Kung Ming} and Lu, {Kuen Long} and Liou, {Jian Chiun}",
year = "2018",
month = "7",
day = "24",
doi = "10.3390/app8081211",
language = "English",
volume = "8",
journal = "Applied Sciences (Switzerland)",
issn = "2076-3417",
publisher = "Multidisciplinary Digital Publishing Institute (MDPI)",
number = "8",

}

TY - JOUR

T1 - Two dimensional parity check with variable length error detection code for the Non-Volatile Memory of smart data

AU - Gong, Cihun Siyong Alex

AU - Chang, Yung Chang

AU - Huang, Li Ren

AU - Yang, Chih Jen

AU - Ji, Kung Ming

AU - Lu, Kuen Long

AU - Liou, Jian Chiun

PY - 2018/7/24

Y1 - 2018/7/24

N2 - This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30% redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation.

AB - This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30% redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation.

KW - Data integrity

KW - ECC

KW - Memory

KW - Non-volatile

KW - Parity

KW - Protection

KW - Smart sensor

KW - Variable length

KW - Data integrity

KW - ECC

KW - Memory

KW - Non-volatile

KW - Parity

KW - Protection

KW - Smart sensor

KW - Variable length

UR - http://www.scopus.com/inward/record.url?scp=85050396054&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85050396054&partnerID=8YFLogxK

U2 - 10.3390/app8081211

DO - 10.3390/app8081211

M3 - Article

AN - SCOPUS:85050396054

VL - 8

JO - Applied Sciences (Switzerland)

JF - Applied Sciences (Switzerland)

SN - 2076-3417

IS - 8

M1 - 1211

ER -