Investigated of identification circuit with fuse sensors in consumer inkjet printhead chip

Jian Chiun Liou; Wen Chieh Lin; Wen De Lin

doi:10.1109/ICCE-TW.2016.7520970

Investigated of identification circuit with fuse sensors in consumer inkjet printhead chip

Jian Chiun Liou, Wen Chieh Lin, Wen De Lin

研究成果: 書貢獻/報告類型 › 會議貢獻

摘要

This paper describes the work aimed to develop a thermal inkjet printhead with identification circuit. Identification integrated circuit is a fuse in series with the drain of MOS, after waiting for the wafer factory burn break fuse line. When VID is greater than 3.6V, namely its fuse is blown. It can conclude that its fuse blown point voltage is equal to 3.6V. Curve VGS equal to 15.5V blown fuse parameter analysis can be done.

原文	英語
主出版物標題	2016 IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016
發行者	Institute of Electrical and Electronics Engineers Inc.
ISBN（電子）	9781509020737
DOIs	https://doi.org/10.1109/ICCE-TW.2016.7520970
出版狀態	已發佈 - 七月 25 2016
對外發佈	Yes
事件	3rd IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016 - Nantou County, 臺灣持續時間: 五月 27 2016 → 五月 30 2016

會議

會議	3rd IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016
國家	臺灣
城市	Nantou County
期間	5/27/16 → 5/30/16

ASJC Scopus subject areas

Computer Science Applications
Electrical and Electronic Engineering
Media Technology
Computer Networks and Communications
Signal Processing

存取文件

10.1109/ICCE-TW.2016.7520970

其它文件與鏈接

指紋深入研究「Investigated of identification circuit with fuse sensors in consumer inkjet printhead chip」主題。共同形成了獨特的指紋。

引用此

Liou, JC, Lin, WC & Lin, WD 2016, Investigated of identification circuit with fuse sensors in consumer inkjet printhead chip. 於 2016 IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016., 7520970, Institute of Electrical and Electronics Engineers Inc., 3rd IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016, Nantou County, 臺灣, 5/27/16. https://doi.org/10.1109/ICCE-TW.2016.7520970

@inproceedings{46c6d514006544a39c21b4d795f0f796,

title = "Investigated of identification circuit with fuse sensors in consumer inkjet printhead chip",

abstract = "This paper describes the work aimed to develop a thermal inkjet printhead with identification circuit. Identification integrated circuit is a fuse in series with the drain of MOS, after waiting for the wafer factory burn break fuse line. When VID is greater than 3.6V, namely its fuse is blown. It can conclude that its fuse blown point voltage is equal to 3.6V. Curve VGS equal to 15.5V blown fuse parameter analysis can be done.",

author = "Liou, {Jian Chiun} and Lin, {Wen Chieh} and Lin, {Wen De}",

year = "2016",

month = jul,

day = "25",

doi = "10.1109/ICCE-TW.2016.7520970",

language = "English",

booktitle = "2016 IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "3rd IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016 ; Conference date: 27-05-2016 Through 30-05-2016",

}

TY - GEN

T1 - Investigated of identification circuit with fuse sensors in consumer inkjet printhead chip

AU - Liou, Jian Chiun

AU - Lin, Wen Chieh

AU - Lin, Wen De

PY - 2016/7/25

Y1 - 2016/7/25

N2 - This paper describes the work aimed to develop a thermal inkjet printhead with identification circuit. Identification integrated circuit is a fuse in series with the drain of MOS, after waiting for the wafer factory burn break fuse line. When VID is greater than 3.6V, namely its fuse is blown. It can conclude that its fuse blown point voltage is equal to 3.6V. Curve VGS equal to 15.5V blown fuse parameter analysis can be done.

AB - This paper describes the work aimed to develop a thermal inkjet printhead with identification circuit. Identification integrated circuit is a fuse in series with the drain of MOS, after waiting for the wafer factory burn break fuse line. When VID is greater than 3.6V, namely its fuse is blown. It can conclude that its fuse blown point voltage is equal to 3.6V. Curve VGS equal to 15.5V blown fuse parameter analysis can be done.

UR - http://www.scopus.com/inward/record.url?scp=84983475379&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84983475379&partnerID=8YFLogxK

U2 - 10.1109/ICCE-TW.2016.7520970

DO - 10.1109/ICCE-TW.2016.7520970

M3 - Conference contribution

AN - SCOPUS:84983475379

BT - 2016 IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 3rd IEEE International Conference on Consumer Electronics-Taiwan, ICCE-TW 2016

Y2 - 27 May 2016 through 30 May 2016

ER -