Factory throughput improvements through intelligent integrated delivery in semiconductor fabrication facilities

Bo Li, Johnny Wu, Wayne Carriker, Ross Giddings

研究成果: 雜誌貢獻文章

8 引文 (Scopus)

摘要

"Integrated Delivery" is a system that integrates the automated material handling systems (AMHSs) with process tools to automate the flow of material through a semiconductor fabrication facility (fab). It was developed to streamline operations in fully mechanized 300-mm wafer fabs by automating the delivery of lots to/from the tools, and automating all aspects of lot processing, with no manual intervention. Within this context, lot delivery performance is a critical factor impacting factory throughput. Poor material delivery performance translates into tools sitting idle waiting for lots to be delivered, which increases tool cycle time and decreases output This paper describes intelligent integrated delivery (IID) capabilities, including just-in-time proactive material movement and delivery prioritization, to reduce delivery time impacts. These capabilities significantly reduce the lot delivery queue time, and as a result, measurably improve factory throughput. The results have been demonstrated via theoretical modeling, as well through actual deployment in Intel's 300 mm fabs.
原文英語
頁(從 - 到)222-231
頁數10
期刊IEEE Transactions on Semiconductor Manufacturing
18
發行號1
DOIs
出版狀態已發佈 - 二月 1 2005
對外發佈Yes

指紋

industrial plants
Industrial plants
delivery
Throughput
Semiconductor materials
Fabrication
fabrication
Materials handling
materials handling
Processing
wafers
cycles
output

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

引用此文

Factory throughput improvements through intelligent integrated delivery in semiconductor fabrication facilities. / Li, Bo; Wu, Johnny; Carriker, Wayne; Giddings, Ross.

於: IEEE Transactions on Semiconductor Manufacturing, 卷 18, 編號 1, 01.02.2005, p. 222-231.

研究成果: 雜誌貢獻文章

@article{7d4831d4b3aa4d37ac248b89564960de,
title = "Factory throughput improvements through intelligent integrated delivery in semiconductor fabrication facilities",
abstract = "{"}Integrated Delivery{"} is a system that integrates the automated material handling systems (AMHSs) with process tools to automate the flow of material through a semiconductor fabrication facility (fab). It was developed to streamline operations in fully mechanized 300-mm wafer fabs by automating the delivery of lots to/from the tools, and automating all aspects of lot processing, with no manual intervention. Within this context, lot delivery performance is a critical factor impacting factory throughput. Poor material delivery performance translates into tools sitting idle waiting for lots to be delivered, which increases tool cycle time and decreases output This paper describes intelligent integrated delivery (IID) capabilities, including just-in-time proactive material movement and delivery prioritization, to reduce delivery time impacts. These capabilities significantly reduce the lot delivery queue time, and as a result, measurably improve factory throughput. The results have been demonstrated via theoretical modeling, as well through actual deployment in Intel's 300 mm fabs.",
keywords = "Automated material handling system, Intelligent integrated delivery, Throughput, Tool cycle time",
author = "Bo Li and Johnny Wu and Wayne Carriker and Ross Giddings",
year = "2005",
month = "2",
day = "1",
doi = "10.1109/TSM.2004.840530",
language = "English",
volume = "18",
pages = "222--231",
journal = "IEEE Transactions on Semiconductor Manufacturing",
issn = "0894-6507",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "1",

}

TY - JOUR

T1 - Factory throughput improvements through intelligent integrated delivery in semiconductor fabrication facilities

AU - Li, Bo

AU - Wu, Johnny

AU - Carriker, Wayne

AU - Giddings, Ross

PY - 2005/2/1

Y1 - 2005/2/1

N2 - "Integrated Delivery" is a system that integrates the automated material handling systems (AMHSs) with process tools to automate the flow of material through a semiconductor fabrication facility (fab). It was developed to streamline operations in fully mechanized 300-mm wafer fabs by automating the delivery of lots to/from the tools, and automating all aspects of lot processing, with no manual intervention. Within this context, lot delivery performance is a critical factor impacting factory throughput. Poor material delivery performance translates into tools sitting idle waiting for lots to be delivered, which increases tool cycle time and decreases output This paper describes intelligent integrated delivery (IID) capabilities, including just-in-time proactive material movement and delivery prioritization, to reduce delivery time impacts. These capabilities significantly reduce the lot delivery queue time, and as a result, measurably improve factory throughput. The results have been demonstrated via theoretical modeling, as well through actual deployment in Intel's 300 mm fabs.

AB - "Integrated Delivery" is a system that integrates the automated material handling systems (AMHSs) with process tools to automate the flow of material through a semiconductor fabrication facility (fab). It was developed to streamline operations in fully mechanized 300-mm wafer fabs by automating the delivery of lots to/from the tools, and automating all aspects of lot processing, with no manual intervention. Within this context, lot delivery performance is a critical factor impacting factory throughput. Poor material delivery performance translates into tools sitting idle waiting for lots to be delivered, which increases tool cycle time and decreases output This paper describes intelligent integrated delivery (IID) capabilities, including just-in-time proactive material movement and delivery prioritization, to reduce delivery time impacts. These capabilities significantly reduce the lot delivery queue time, and as a result, measurably improve factory throughput. The results have been demonstrated via theoretical modeling, as well through actual deployment in Intel's 300 mm fabs.

KW - Automated material handling system

KW - Intelligent integrated delivery

KW - Throughput

KW - Tool cycle time

UR - http://www.scopus.com/inward/record.url?scp=13844267595&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=13844267595&partnerID=8YFLogxK

U2 - 10.1109/TSM.2004.840530

DO - 10.1109/TSM.2004.840530

M3 - Article

AN - SCOPUS:13844267595

VL - 18

SP - 222

EP - 231

JO - IEEE Transactions on Semiconductor Manufacturing

JF - IEEE Transactions on Semiconductor Manufacturing

SN - 0894-6507

IS - 1

ER -