Correction: Formation and characterization of the high precision nanoscale thin film resistors on radio frequency application [Int. J. Electrochem. Sci., 10 (2015) (6517-6526)]

Huei Yu Huang; Chia-Yu Wu; Chi Chang Wu

doi:10.20964/2018.06.200

Correction: Formation and characterization of the high precision nanoscale thin film resistors on radio frequency application [Int. J. Electrochem. Sci., 10 (2015) (6517-6526)]

Huei Yu Huang, Chia-Yu Wu, Chi Chang Wu

研究成果: 雜誌貢獻 › 評論/辯論

摘要

This was not noticed at the time by the authors and it is corrected by this correction now, and we apologize for any inconvenience this may cause.

原文	英語
頁（從 - 到）	6155
頁數	1
期刊	International Journal of Electrochemical Science
卷	13
發行號	6
DOIs	https://doi.org/10.20964/2018.06.200
出版狀態	已發佈 - 六月 1 2018

指紋

ASJC Scopus subject areas

Electrochemistry

引用此

Huang, H. Y., Wu, C-Y., & Wu, C. C. (2018). Correction: Formation and characterization of the high precision nanoscale thin film resistors on radio frequency application [Int. J. Electrochem. Sci., 10 (2015) (6517-6526)]. International Journal of Electrochemical Science, 13(6), 6155. https://doi.org/10.20964/2018.06.200

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存取文件

10.20964/2018.06.200