Bridging fault diagnosis to identify the layer of systematic defects

Po Juei Chen, James Chien-Mo Li, Hsing-Jasmine Chao

研究成果: 書貢獻/報告類型會議貢獻

3 引文 斯高帕斯(Scopus)

摘要

Diagnosis for systematic defects is very critical for yield learning in nanometer technology. This paper presents a bridging fault diagnosis which identifies a single layer of systematic defects (LSD), where more than expected numbers of bridging faults are located. The proposed technique is a layout-aware diagnosis which contains bridging pair extraction, structural analysis, and layer-oriented covering. Instead of treating each failing CUT independently, a statistical method (Z-test) is applied to diagnose all CUTs simultaneously. Experiments on six of seven large ISCAS'89 benchmark circuits successfully diagnose LSD for single bridging fault as well as multiple bridging faults.
原文英語
主出版物標題Proceedings of the Asian Test Symposium
頁面349-354
頁數6
DOIs
出版狀態已發佈 - 2009
事件18th Asian Test Symposium, ATS 2009 - Taichung, 臺灣
持續時間: 十一月 23 2009十一月 26 2009

其他

其他18th Asian Test Symposium, ATS 2009
國家臺灣
城市Taichung
期間11/23/0911/26/09

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • 引用此

    Chen, P. J., Chien-Mo Li, J., & Chao, H-J. (2009). Bridging fault diagnosis to identify the layer of systematic defects. 於 Proceedings of the Asian Test Symposium (頁 349-354). [5359310] https://doi.org/10.1109/ATS.2009.58