Diagnosis for systematic defects is very critical for yield learning in nanometer technology. This paper presents a bridging fault diagnosis which identifies a single layer of systematic defects (LSD), where more than expected numbers of bridging faults are located. The proposed technique is a layout-aware diagnosis which contains bridging pair extraction, structural analysis, and layer-oriented covering. Instead of treating each failing CUT independently, a statistical method (Z-test) is applied to diagnose all CUTs simultaneously. Experiments on six of seven large ISCAS'89 benchmark circuits successfully diagnose LSD for single bridging fault as well as multiple bridging faults.
|主出版物標題||Proceedings of the Asian Test Symposium|
|出版狀態||已發佈 - 2009|
|事件||18th Asian Test Symposium, ATS 2009 - Taichung, 臺灣|
持續時間: 11月 23 2009 → 11月 26 2009
|其他||18th Asian Test Symposium, ATS 2009|
|期間||11/23/09 → 11/26/09|
ASJC Scopus subject areas