摘要
This paper describes a novel optical system capable of measuring 5-axis (five degrees of freedom) object surface movement without the need for special surface preparation or stringent alignment. The compact optical system is based on electronic speckle photography (ESP) and is designed to be insensitive to out-of-plane movement. Experiments were conducted to measure the 5-axis motion simulated by a 6-axis motion system. The results show that the optical system accurately resolves the motion on every axis successfully, with the expected insensitivity to out-of-plane displacements. A possible application of the technique in strain measurement is also addressed in the paper.
| 原文 | 英語 |
|---|---|
| 文章編號 | 12 |
| 頁（從 - 到） | 66-73 |
| 頁數 | 8 |
| 期刊 | Proceedings of SPIE - The International Society for Optical Engineering |
| 卷 | 5606 |
| DOIs | |
| 出版狀態 | 已發佈 - 十二月 1 2004 |
| 對外發佈 | Yes |
| 事件 | Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II - Philadelphia, PA, 美国 持續時間: 十月 26 2004 → 十月 27 2004 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
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Zhao, W., Wu, J., & Beck, T. (2004). A novel optical technique for measuring 5-axis surface movement. Proceedings of SPIE - The International Society for Optical Engineering, 5606, 66-73. [12]. https://doi.org/10.1117/12.571463