A 0.5V 1.27mW nose-on-a-chip for rapid diagnosis of ventilator-associated pneumonia

Kea Tiong Tang, Shih Wen Chiu, Chung-Hung Shih, Chia Ling Chang, Chia Min Yang, Da Jeng Yao, Jen Huo Wang, Chien Ming Huang, Hsin Chen, Kwuang Han Chang, Chih Cheng Hsieh, Ting Hau Chang, Meng Fan Chang, Chia Min Wang, Yi Wen Liu, Tsan Jieh Chen, Chia Hsiang Yang, Herming Chiueh, Jyuo Min Shyu

研究成果: 書貢獻/報告類型會議貢獻

16 引文 斯高帕斯(Scopus)

摘要

Ventilator-associated pneumonia (VAP) is the most frequently acquired infection among patients that receive mechanical ventilation in the intensive-care unit (ICU). The mortality rate for VAP lies in the 20-to-50% range and could be even higher in some ICUs. A standard operation procedure to VAP treatment includes a sequence of chest radiography, sputum gram stain, sputum culture, and empiric therapy, initially with antibiotics covering broad pathogens. However, collection of the gram stain and culture of lower respiratory tract specimen is usually not time-efficient (up to 5 days), delaying the initiation of therapy and unacceptable for critically ill patients. A rapid and accurate diagnosis for VAP is therefore crucial, but still unavailable. It is known that microorganisms generate complex metabolites during infection. Fast detection is feasible by examining metabolic wastes in proximal end of the expiratory device, demanding a miniaturized, battery-powered, gas-sensing device. In this work, a fully integrated low-power nose-on-a-chip with a robust learning kernel is developed for such a vital clinical need.
原文英語
主出版物標題2014 IEEE International Solid-State Circuits Conference, ISSCC 2014 - Digest of Technical Papers
發行者Institute of Electrical and Electronics Engineers Inc.
頁面420-421
頁數2
ISBN(列印)9781479909186
DOIs
出版狀態已發佈 - 2014
事件2014 61st IEEE International Solid-State Circuits Conference, ISSCC 2014 - San Francisco, CA, 美国
持續時間: 二月 9 2014二月 13 2014

出版系列

名字Digest of Technical Papers - IEEE International Solid-State Circuits Conference
57
ISSN(列印)0193-6530

其他

其他2014 61st IEEE International Solid-State Circuits Conference, ISSCC 2014
國家/地區美国
城市San Francisco, CA
期間2/9/142/13/14

ASJC Scopus subject areas

  • 電子、光磁材料
  • 電氣與電子工程

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