Two dimensional parity check with variable length error detection code for the Non-Volatile Memory of smart data

Cihun Siyong Alex Gong, Yung Chang Chang, Li Ren Huang, Chih Jen Yang, Kung Ming Ji, Kuen Long Lu, Jian Chiun Liou

Research output: Contribution to journalArticle

1 Citation (Scopus)


This paper proposes a novel technology of memory protection for the Non-Volatile Memory (NVM), applied to smart sensors and smart data. Based on the asymmetry of failure rate between the statuses of bit-0 and bit-1 in the non-volatile memory, as a result of the pollution of the radiation of cosmic ray, a two-dimensional parity with variable length error detection code (2D-VLEDC) for memory protection is proposed. 2D-VLEDC has the feature of variable length of redundant bits varied with content of data word in the NVM. The experimental results show that the same error detection quality could be achieved with a 30% redundancy improvement by applying the proposed 2D-VLEDC. The proposed design is particularly suitable for the use of safety-related fields, such as the automotive electronics and industrial non-volatile memories involved in the industrial automation.

Original languageEnglish
Article number1211
JournalApplied Sciences (Switzerland)
Issue number8
Publication statusPublished - Jul 24 2018



  • Data integrity
  • ECC
  • Memory
  • Non-volatile
  • Parity
  • Protection
  • Smart sensor
  • Variable length

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation
  • Engineering(all)
  • Process Chemistry and Technology
  • Computer Science Applications
  • Fluid Flow and Transfer Processes

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