Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering

G. M. Chow, W. C. Goh, Y. K. Hwu, T. S. Cho, J. H. Je, H. H. Lee, H. C. Kang, D. Y. Noh, C. K. Lin, W. D. Chang

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Abstract

Conventional x-ray diffraction failed to provide correct information on alloying of materials made of elements with close lattice parameters, even for elements commonly accepted to have miscibility. Using anomalous x-ray scattering, we showed that nanostructured NiCo films did not necessarily form solid solution as expected from their phase diagram or suggested by the results of conventional x-ray diffraction.

Original languageEnglish
Pages (from-to)2503-2505
Number of pages3
JournalApplied Physics Letters
Volume75
Issue number16
Publication statusPublished - Oct 18 1999
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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    Chow, G. M., Goh, W. C., Hwu, Y. K., Cho, T. S., Je, J. H., Lee, H. H., Kang, H. C., Noh, D. Y., Lin, C. K., & Chang, W. D. (1999). Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering. Applied Physics Letters, 75(16), 2503-2505.