Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering

G. M. Chow, W. C. Goh, Y. K. Hwu, T. S. Cho, J. H. Je, H. H. Lee, H. C. Kang, D. Y. Noh, C. K. Lin, W. D. Chang

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

Conventional x-ray diffraction failed to provide correct information on alloying of materials made of elements with close lattice parameters, even for elements commonly accepted to have miscibility. Using anomalous x-ray scattering, we showed that nanostructured NiCo films did not necessarily form solid solution as expected from their phase diagram or suggested by the results of conventional x-ray diffraction.

Original languageEnglish
Pages (from-to)2503-2505
Number of pages3
JournalApplied Physics Letters
Volume75
Issue number16
Publication statusPublished - Oct 18 1999
Externally publishedYes

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x ray scattering
x ray diffraction
alloying
lattice parameters
solid solutions
solubility
phase diagrams

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Chow, G. M., Goh, W. C., Hwu, Y. K., Cho, T. S., Je, J. H., Lee, H. H., ... Chang, W. D. (1999). Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering. Applied Physics Letters, 75(16), 2503-2505.

Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering. / Chow, G. M.; Goh, W. C.; Hwu, Y. K.; Cho, T. S.; Je, J. H.; Lee, H. H.; Kang, H. C.; Noh, D. Y.; Lin, C. K.; Chang, W. D.

In: Applied Physics Letters, Vol. 75, No. 16, 18.10.1999, p. 2503-2505.

Research output: Contribution to journalArticle

Chow, GM, Goh, WC, Hwu, YK, Cho, TS, Je, JH, Lee, HH, Kang, HC, Noh, DY, Lin, CK & Chang, WD 1999, 'Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering', Applied Physics Letters, vol. 75, no. 16, pp. 2503-2505.
Chow GM, Goh WC, Hwu YK, Cho TS, Je JH, Lee HH et al. Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering. Applied Physics Letters. 1999 Oct 18;75(16):2503-2505.
Chow, G. M. ; Goh, W. C. ; Hwu, Y. K. ; Cho, T. S. ; Je, J. H. ; Lee, H. H. ; Kang, H. C. ; Noh, D. Y. ; Lin, C. K. ; Chang, W. D. / Structure determination of nanostructured Ni-Co films by anomalous x-ray scattering. In: Applied Physics Letters. 1999 ; Vol. 75, No. 16. pp. 2503-2505.
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