Resonance frequency analysis for osseointegration in four surgical conditions of dental implants

Shih Fen Lin, Li-Chern Pan, Sheng-Yang Lee, Yu Hao Peng, Tzu Chin Hsiao

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The establishment of osseointegration following dental implant placement is a major contributing factor to the clinical success and long-term function of implant-retained prosthesis. Radiographic examination and palpation have been two of the methods often used in clinical assessment for implant stability for years. However, theses radiographs are two-dimensional and difficult to standardize. The investigation was designed to study the use of resonance frequency analysis in search of the stability of the implant-tissue interface in vitro. Resonance frequency was measured when test implants were embedded in bakelites. The change in stiffness observed during bone healing was modeled by embedding implants in gypsum during setting period. Our results showed that there was an increase in resonance frequency related to stiffness increment during osseointegration.

Original languageEnglish
Title of host publicationAnnual Reports of the Research Reactor Institute, Kyoto University
Pages2998-3001
Number of pages4
Volume3
Publication statusPublished - 2001
Event23rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society - Istanbul, Turkey
Duration: Oct 25 2001Oct 28 2001

Other

Other23rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society
CountryTurkey
CityIstanbul
Period10/25/0110/28/01

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Keywords

  • Dental implant
  • Osseointegration
  • Resonance frequency
  • Stability

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Mechanical Engineering

Cite this

Lin, S. F., Pan, L-C., Lee, S-Y., Peng, Y. H., & Hsiao, T. C. (2001). Resonance frequency analysis for osseointegration in four surgical conditions of dental implants. In Annual Reports of the Research Reactor Institute, Kyoto University (Vol. 3, pp. 2998-3001)