Nanoparticle sorting in silicon waveguide arrays

H. T. Zhao, Y. Zhang, L. K. Chin, P. H. Yap, K. Wang, W. Ser, A. Q. Liu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

This paper presents the optical fractionation of nanoparticles in silicon waveguide arrays. The optical lattice is generated by evanescent coupling in silicon waveguide arrays. The hotspot size is tunable by changing the refractive index of surrounding liquids. In the experiment, 0.2-μm and 0.5-μm particles are separated with a recovery rate of 95.76%. This near-field approach is a promising candidate for manipulating nanoscale biomolecules and is anticipated to benefit the biomedical applications such as exosome purification, DNA optical mapping, cell-cell interaction, etc.

Original languageEnglish
Title of host publicationOptical Trapping and Optical Micromanipulation XIV
EditorsGabriel C. Spalding, Kishan Dholakia
PublisherSPIE
ISBN (Electronic)9781510611511
DOIs
Publication statusPublished - Jan 1 2017
EventOptical Trapping and Optical Micromanipulation XIV 2017 - San Diego, United States
Duration: Aug 6 2017Aug 10 2017

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10347
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceOptical Trapping and Optical Micromanipulation XIV 2017
CountryUnited States
CitySan Diego
Period8/6/178/10/17

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Keywords

  • near-field
  • optical fractionation
  • waveguide array

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Zhao, H. T., Zhang, Y., Chin, L. K., Yap, P. H., Wang, K., Ser, W., & Liu, A. Q. (2017). Nanoparticle sorting in silicon waveguide arrays. In G. C. Spalding, & K. Dholakia (Eds.), Optical Trapping and Optical Micromanipulation XIV [103472L] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 10347). SPIE. https://doi.org/10.1117/12.2273251