High throughput and parallel flow cytometer using microball lens integrated 3D microfluidic device

Yu Jui Fan, Yen Ling Weng, Horn Jiunn Sheen

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We report an ultrahigh throughput microflow cytometer which has 32 detection flow channels with 3D flow focusing for each channel. This flow cytometer is realized by integrating a high N.A. microball lens array with a 3D microfluidic device, which allows introducing cell samples into 32 sample channels. There are, 64 channels for sheath flow used for parallel lateral focusing and 32 sounding flows for parallel sounding focusing. All microchannels use only three inlets. Results show that a 95% yield rate by standard 10 μm bead detection has been achieved, and a throughput of 1,400,000 cell/sec has been accomplished on a single device.

Original languageEnglish
Title of host publication2017 IEEE 12th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages426-429
Number of pages4
ISBN (Electronic)9781509030590
DOIs
Publication statusPublished - Aug 25 2017
Event12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017 - Los Angeles, United States
Duration: Apr 9 2017Apr 12 2017

Conference

Conference12th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017
CountryUnited States
CityLos Angeles
Period4/9/174/12/17

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Keywords

  • BioMEMS
  • flow cytometry
  • microfluidics

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Mechanical Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

Cite this

Fan, Y. J., Weng, Y. L., & Sheen, H. J. (2017). High throughput and parallel flow cytometer using microball lens integrated 3D microfluidic device. In 2017 IEEE 12th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2017 (pp. 426-429). [8017057] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NEMS.2017.8017057