Factory throughput improvements through intelligent integrated delivery in semiconductor fabrication facilities

Bo Li, Johnny Wu, Wayne Carriker, Ross Giddings

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

"Integrated Delivery" is a system that integrates the automated material handling systems (AMHSs) with process tools to automate the flow of material through a semiconductor fabrication facility (fab). It was developed to streamline operations in fully mechanized 300-mm wafer fabs by automating the delivery of lots to/from the tools, and automating all aspects of lot processing, with no manual intervention. Within this context, lot delivery performance is a critical factor impacting factory throughput. Poor material delivery performance translates into tools sitting idle waiting for lots to be delivered, which increases tool cycle time and decreases output This paper describes intelligent integrated delivery (IID) capabilities, including just-in-time proactive material movement and delivery prioritization, to reduce delivery time impacts. These capabilities significantly reduce the lot delivery queue time, and as a result, measurably improve factory throughput. The results have been demonstrated via theoretical modeling, as well through actual deployment in Intel's 300 mm fabs.

Original languageEnglish
Pages (from-to)222-231
Number of pages10
JournalIEEE Transactions on Semiconductor Manufacturing
Volume18
Issue number1
DOIs
Publication statusPublished - Feb 1 2005
Externally publishedYes

Fingerprint

industrial plants
Industrial plants
delivery
Throughput
Semiconductor materials
Fabrication
fabrication
Materials handling
materials handling
Processing
wafers
cycles
output

Keywords

  • Automated material handling system
  • Intelligent integrated delivery
  • Throughput
  • Tool cycle time

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

Cite this

Factory throughput improvements through intelligent integrated delivery in semiconductor fabrication facilities. / Li, Bo; Wu, Johnny; Carriker, Wayne; Giddings, Ross.

In: IEEE Transactions on Semiconductor Manufacturing, Vol. 18, No. 1, 01.02.2005, p. 222-231.

Research output: Contribution to journalArticle

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