Downscaling the sample thickness to sub-micrometers by employing organic photovoltaic materials as a charge-generation layer in the time-of-flight measurement

Shun Wei Liu, Chih Chien Lee, Wei Cheng Su, Chih Hsien Yuan, Chun Feng Lin, Kuan Ting Chen, Yi Sheng Shu, Ya Ze Li, Tsung Hao Su, Bo Yao Huang, Wen Chang Chang, Yu Hsuan Liu

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

Time-of-flight (TOF) measurements typically require a sample thickness of several micrometers for determining the carrier mobility, thus rendering the applicability inefficient and unreliable because the sample thicknesses are orders of magnitude higher than those in real optoelectronic devices. Here, we use subphthalocyanine (SubPc):C70 as a charge-generation layer (CGL) in the TOF measurement and a commonly hole-transporting layer, N,N′-diphenyl-N,N′-bis(1,1′-biphenyl)-4,4′-diamine (NPB), as a standard material under test. When the NPB thickness is reduced from 2 to 0.3 μm and with a thin 10-nm CGL, the hole transient signal still shows non-dispersive properties under various applied fields, and thus the hole mobility is determined accordingly. Only 1-μm NPB is required for determining the electron mobility by using the proposed CGL. Both the thicknesses are the thinnest value reported to data. In addition, the flexibility of fabrication process of small molecules can deposit the proposed CGL underneath and atop the material under test. Therefore, this technique is applicable to small-molecule and polymeric materials. We also propose a new approach to design the TOF sample using an optical simulation. These results strongly demonstrate that the proposed technique is valuable tool in determining the carrier mobility and may spur additional research in this field.

Original languageEnglish
Article number10384
JournalScientific Reports
Volume5
DOIs
Publication statusPublished - May 22 2015
Externally publishedYes

Fingerprint

micrometers
carrier mobility
hole mobility
diamines
optoelectronic devices
electron mobility
molecules
flexibility
deposits
fabrication
simulation

ASJC Scopus subject areas

  • General

Cite this

Downscaling the sample thickness to sub-micrometers by employing organic photovoltaic materials as a charge-generation layer in the time-of-flight measurement. / Liu, Shun Wei; Lee, Chih Chien; Su, Wei Cheng; Yuan, Chih Hsien; Lin, Chun Feng; Chen, Kuan Ting; Shu, Yi Sheng; Li, Ya Ze; Su, Tsung Hao; Huang, Bo Yao; Chang, Wen Chang; Liu, Yu Hsuan.

In: Scientific Reports, Vol. 5, 10384, 22.05.2015.

Research output: Contribution to journalArticle

Liu, Shun Wei ; Lee, Chih Chien ; Su, Wei Cheng ; Yuan, Chih Hsien ; Lin, Chun Feng ; Chen, Kuan Ting ; Shu, Yi Sheng ; Li, Ya Ze ; Su, Tsung Hao ; Huang, Bo Yao ; Chang, Wen Chang ; Liu, Yu Hsuan. / Downscaling the sample thickness to sub-micrometers by employing organic photovoltaic materials as a charge-generation layer in the time-of-flight measurement. In: Scientific Reports. 2015 ; Vol. 5.
@article{536ebea4b2094750a27f16406941f645,
title = "Downscaling the sample thickness to sub-micrometers by employing organic photovoltaic materials as a charge-generation layer in the time-of-flight measurement",
abstract = "Time-of-flight (TOF) measurements typically require a sample thickness of several micrometers for determining the carrier mobility, thus rendering the applicability inefficient and unreliable because the sample thicknesses are orders of magnitude higher than those in real optoelectronic devices. Here, we use subphthalocyanine (SubPc):C70 as a charge-generation layer (CGL) in the TOF measurement and a commonly hole-transporting layer, N,N′-diphenyl-N,N′-bis(1,1′-biphenyl)-4,4′-diamine (NPB), as a standard material under test. When the NPB thickness is reduced from 2 to 0.3 μm and with a thin 10-nm CGL, the hole transient signal still shows non-dispersive properties under various applied fields, and thus the hole mobility is determined accordingly. Only 1-μm NPB is required for determining the electron mobility by using the proposed CGL. Both the thicknesses are the thinnest value reported to data. In addition, the flexibility of fabrication process of small molecules can deposit the proposed CGL underneath and atop the material under test. Therefore, this technique is applicable to small-molecule and polymeric materials. We also propose a new approach to design the TOF sample using an optical simulation. These results strongly demonstrate that the proposed technique is valuable tool in determining the carrier mobility and may spur additional research in this field.",
author = "Liu, {Shun Wei} and Lee, {Chih Chien} and Su, {Wei Cheng} and Yuan, {Chih Hsien} and Lin, {Chun Feng} and Chen, {Kuan Ting} and Shu, {Yi Sheng} and Li, {Ya Ze} and Su, {Tsung Hao} and Huang, {Bo Yao} and Chang, {Wen Chang} and Liu, {Yu Hsuan}",
year = "2015",
month = "5",
day = "22",
doi = "10.1038/srep10384",
language = "English",
volume = "5",
journal = "Scientific Reports",
issn = "2045-2322",
publisher = "Nature Publishing Group",

}

TY - JOUR

T1 - Downscaling the sample thickness to sub-micrometers by employing organic photovoltaic materials as a charge-generation layer in the time-of-flight measurement

AU - Liu, Shun Wei

AU - Lee, Chih Chien

AU - Su, Wei Cheng

AU - Yuan, Chih Hsien

AU - Lin, Chun Feng

AU - Chen, Kuan Ting

AU - Shu, Yi Sheng

AU - Li, Ya Ze

AU - Su, Tsung Hao

AU - Huang, Bo Yao

AU - Chang, Wen Chang

AU - Liu, Yu Hsuan

PY - 2015/5/22

Y1 - 2015/5/22

N2 - Time-of-flight (TOF) measurements typically require a sample thickness of several micrometers for determining the carrier mobility, thus rendering the applicability inefficient and unreliable because the sample thicknesses are orders of magnitude higher than those in real optoelectronic devices. Here, we use subphthalocyanine (SubPc):C70 as a charge-generation layer (CGL) in the TOF measurement and a commonly hole-transporting layer, N,N′-diphenyl-N,N′-bis(1,1′-biphenyl)-4,4′-diamine (NPB), as a standard material under test. When the NPB thickness is reduced from 2 to 0.3 μm and with a thin 10-nm CGL, the hole transient signal still shows non-dispersive properties under various applied fields, and thus the hole mobility is determined accordingly. Only 1-μm NPB is required for determining the electron mobility by using the proposed CGL. Both the thicknesses are the thinnest value reported to data. In addition, the flexibility of fabrication process of small molecules can deposit the proposed CGL underneath and atop the material under test. Therefore, this technique is applicable to small-molecule and polymeric materials. We also propose a new approach to design the TOF sample using an optical simulation. These results strongly demonstrate that the proposed technique is valuable tool in determining the carrier mobility and may spur additional research in this field.

AB - Time-of-flight (TOF) measurements typically require a sample thickness of several micrometers for determining the carrier mobility, thus rendering the applicability inefficient and unreliable because the sample thicknesses are orders of magnitude higher than those in real optoelectronic devices. Here, we use subphthalocyanine (SubPc):C70 as a charge-generation layer (CGL) in the TOF measurement and a commonly hole-transporting layer, N,N′-diphenyl-N,N′-bis(1,1′-biphenyl)-4,4′-diamine (NPB), as a standard material under test. When the NPB thickness is reduced from 2 to 0.3 μm and with a thin 10-nm CGL, the hole transient signal still shows non-dispersive properties under various applied fields, and thus the hole mobility is determined accordingly. Only 1-μm NPB is required for determining the electron mobility by using the proposed CGL. Both the thicknesses are the thinnest value reported to data. In addition, the flexibility of fabrication process of small molecules can deposit the proposed CGL underneath and atop the material under test. Therefore, this technique is applicable to small-molecule and polymeric materials. We also propose a new approach to design the TOF sample using an optical simulation. These results strongly demonstrate that the proposed technique is valuable tool in determining the carrier mobility and may spur additional research in this field.

UR - http://www.scopus.com/inward/record.url?scp=84930216370&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84930216370&partnerID=8YFLogxK

U2 - 10.1038/srep10384

DO - 10.1038/srep10384

M3 - Article

AN - SCOPUS:84930216370

VL - 5

JO - Scientific Reports

JF - Scientific Reports

SN - 2045-2322

M1 - 10384

ER -