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A robust data retention characteristic of SolGel-derived nanocrystal memory by hot-hole trapping
Chi Chang Wu, Fu Hsiang Ko, Wen Luh Yang, Hsin Chiang You, Fu Ken Liu, Chen Chih Yeh, Pin Lin Liu, Chiou Kou Tung, Ching Hwa Cheng
Research output: Contribution to journal › Article › peer-review
7
Citations
(Scopus)