A novel optical technique for measuring 5-axis surface movement

Weixin Zhao, John Wu, Terry Beck

Research output: Contribution to journalConference article

4 Citations (Scopus)

Abstract

This paper describes a novel optical system capable of measuring 5-axis (five degrees of freedom) object surface movement without the need for special surface preparation or stringent alignment. The compact optical system is based on electronic speckle photography (ESP) and is designed to be insensitive to out-of-plane movement. Experiments were conducted to measure the 5-axis motion simulated by a 6-axis motion system. The results show that the optical system accurately resolves the motion on every axis successfully, with the expected insensitivity to out-of-plane displacements. A possible application of the technique in strain measurement is also addressed in the paper.

Original languageEnglish
Article number12
Pages (from-to)66-73
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5606
DOIs
Publication statusPublished - Dec 1 2004
Externally publishedYes
EventTwo- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II - Philadelphia, PA, United States
Duration: Oct 26 2004Oct 27 2004

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Keywords

  • Correlation
  • Displacement
  • ESP
  • Rotation
  • Speckle
  • Strain
  • Tilt

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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